Iijima Y., Fuji H., Kakimoto K., Sutoh Y., Fujita S., Itoh M., Igarashi M., Hanyu S., Tobita H., Nakamura N., Kikutake R., Daibo M., Nagata M.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Sutoh Y., Itoh M., Igarashi M., Hanyu S., Kutami H., Kikutake R., Daibo M., Suzuki R.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Nakamura N., Takemoto T., Kikutake R.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Ключевые слова: HTS, coated conductors, long conductors, high rate process, REBCO, IBAD process, PLD process, substrate Ni alloy, fabrication, texture, critical current distribution, length
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Fujita S., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K., Nakamura N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K., Nakamura N.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, buffer layers, texture, microstructure, fabrication, length
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Fujita S., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Morita K., Nakamura N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Ключевые слова: HTS, REBCO, IBAD process, high rate process, fabrication, long conductors, texture, critical caracteristics, critical current, length
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Miura M., Nakaoka K., Yoshizumi M., Fukushima H., Ichikawa Y.
Ключевые слова: HTS, coated conductors, TFA-MOD process, fabrication, YBCO, IBAD process, substrate Hastelloy, critical caracteristics, critical current, composition, Jc/B curves, critical current density, angular dependence, doping effect, heat treatment, current-voltage characteristics, experimental results, status
Izumi T., Shiohara Y., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Nakai A., Nakanishi T., Ichikawa H.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, high rate process, deposition setup, reel-to-reel process, fabrication
Ключевые слова: HTS, coated conductors, measurement technique, REBCO, coated conductors multifilamentary, defects
Izumi T., Ito T., Takahashi Y., Yamada Y., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Ichikawa H., HiranoH., Tobita H., Y.Shiohara
Ключевые слова: presentation, HTS, YBCO, coated conductors, TFA-MOD process, fabrication, precursors, high rate process, critical current density
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, growth rate, microstructure, fabrication
Goto T., Izumi T., Shiohara Y., Aoki Y., Hasegawa T., Yamada Y., Sutoh Y., Yajima A., Miura M., Yoshizumi M., Nakai A., Nakanishi T., Ichikawa Y.
Izumi T., Shiohara Y., Mimura M., Sutoh Y., Miura M., Nakaoka K., Yoshizumi M., Nakai A., Nakanishi T., Ichikawa H.
Iijima Y., Saitoh T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Matsuda J., Miura M., Nakaoka K., Yoshizumi M., Nakai A., Nakanishi T.
Ключевые слова: HTS, coated conductors, buffer layers, PLD process, YBCO, TFA-MOD process, IBAD process, surface, nanoscaled roughness, fabrication
Goto T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Yajima A., Yoshinaka A., Miura M., Nakaoka K., Yoshizumi M.
Izumi T., Shiohara Y., Yamada Y., Sakai N., Sutoh Y., Miyata S., Nakao K., Chikumoto N., Ibi A., Kato J.
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miura M., Nakaoka K., Ichikawa H., H.Hirano, T.Ito, Y.Takahashi, H.Tobita, M.Yoshizumi
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, critical current density, fabrication
Goto T., Izumi T., Shiohara Y., Kato T., Hirayama T., Sutoh Y., Yajima A., Miura M., Yoshizumi M., Yashima A.
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J.S., Nakaoka K., Kitoh Y., Yoshizumi M., Nalkanishi T.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, review, critical current, thickness dependence, composition, homogeneity, humidity, fabrication, critical caracteristics
Saitoh T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J., Yajima A., Nakaoka K., Kitoh Y., Yoshizumi M., Suzuki K., Nakai A., Nakanishi T.
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, long conductors, critical current, thickness dependence, composition, Jc/B curves, review, fabrication, critical caracteristics, review
Goto T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J., Yajima A., Nakaoka K., Kitoh Y., Yoshizumi M., Nakanishi T.
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J., Yajima A., Machi T., Nakaoka K., Kitoh Y., Yoshizumi M., Suzuki K., Nakai A., Nakanishi T.
Ключевые слова: HTS, YBCO, REBCO, coated conductors, composition, Jc/B curves, TFA-MOD process, pinning centers, IBAD process, fabrication, critical caracteristics
Saitoh T., Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Miyata S., Matsuda J., Nakaoka K., Kitoh Y., Yoshizumi M., Nakai A., Nakanishi T.
Ключевые слова: HTS, coated conductors, substrate Ni-W, buffer layers, PLD process, fabrication, texture, YBCO
Ключевые слова: HTS, YBCO, coated conductors, TFA-MOD process, microstructure, fabrication, nucleation
Iijima Y., Muroga T., Saitoh T., Izumi T., Shiohara Y., Watanabe T., Kakimoto K., Yamada Y., Iwai H., Hirayama T., Sutoh Y., Miyata S., Sasaki H., Kato T.(tkato@jfcc.or.jp), Ikuhara Y., Ibi A., Sasaki Y.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, PLD process, fabrication, microstructure, grain alignment
Izumi T., Shiohara Y., Yamada Y., Sutoh Y., Matsuda J., Machi T., Nakaoka K., Kitoh Y., Yoshizumi M., Suzuki K., Nakai A., Nakanishi T.
Ключевые слова: HTS, coated conductors, YBCO, YBCO, IBAD process, PLD process, TFA-MOD process, Jc/B curves, fabrication, critical caracteristics
Kakimoto K., Sutoh Y., Ajimura S., Saitoh T.(tsaitoh@fujikura.co.jp), Kaneko N., Hanyu S., Iijima Y.(iijimay@fujikura.co.jp)
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, long conductors, fabrication, length
Iijima Y., Kakimoto K., Sutoh Y., Saitoh T.(tsaitoh@fujikura.co.jp), Hanyu S., Kaneko N.(nkaneko@fujikura.co.jp)
Ключевые слова: HTS, YBCO, IBAD process, template layers, substrate Ni alloy, nanoscaled roughness, grain alignment, fabrication, coated conductors
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Ajimura S.(sajimura@fujikura.co.jp)
Ключевые слова: HTS, coated conductors, buffer layers, IBAD process, YBCO, PLD process, reel-to-reel process, long conductors, coils, critical current, thickness dependence, critical current distribution, homogeneity, current-voltage characteristics, upper critical fields, critical caracteristics, fabrication, power equipment, substrate Hastelloy, magnetic properties
Iijima Y., Kakimoto K.(kakimoto@rd.fujikura.co.jp), Saitoh T., Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, template layers, substrate Hastelloy, PLD process, coils solenoidal, reel-to-reel process, long conductors, current-voltage characteristics, critical current density, thickness dependence, tensile tests, bending process, experimental results, fabrication, power equipment, critical caracteristics, quality control
Saitoh T., Kakimoto K., Kato T., Hirayama T., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Kaneko N.
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, IBAD process, template layers, texture, fabrication
Iijima Y., Muroga T., Nagaya S., Kashima N., Saitoh T., Izumi T., Shiohara Y., Watanabe T., Kakimoto K., Yamada Y., Iwai H., Hirayama T., Sutoh Y., Niwa T., Miyata S., Sasaki H., Kato T.(tkato@jfcc.or.jp), Ikuhara Y., Ibi A., Sasaki Y.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, reel-to-reel process, CVD process, multistage process, substrate Hastelloy, grain alignment, microstructure, fabrication
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y.(ysutoh@fujikura.co.jp), Kaneko N.
Saitoh T., Kakimoto K., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Ajimura S.
Saitoh T., Kakimoto K., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Ajimura S.
Iijima Y., Saitoh T., Kakimoto K., Ajimura S., Sutoh Y.(ysutoh@fujikura.co.jp)
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